Low Temperature Impact Test Device
Low Temperature Impact Test Device
- Detail
- Parameters
Low Temperature Impact Test Device
1. Introduction
Low temperature impact test apparatus is designed to meet the test requirements of IEC60884-1 clause 30.4 figure 27 & figure 42, IEC60811-1-4, VDE0620, GB2951.4, GB2099.1 clause 24.4 and 30.4 figure 27 & figure 42 and etc.. It is applied to do the impact test under the condition of low temperature for cord, cable and flexible wire with PE sheath, and flexible wire without PE sheath. This device should work with low temperature chamber and it should be placed on a 40mm thick sponge rubber pad.
2. Specification
Station | 1 |
Falling weight (g) | 100*1, 200*1, 300*1, 400*1, 500*1, 600*1, 750*1, 1000*1, 1250*1, 1500*1 |
Falling impact height (mm) | 100 |
Steel block | Φ20, bottom arc: R300, 100g |
Release mode | Manual, mechanical release |
Table 1：Fixed cable samples, the falling weight used in test specified in below tables:
OD mm | Falling weight (g) | |
> | <&= | |
- | 4.0 | 100 |
4.0 | 6.0 | 200 |
6.0 | 9.0 | 300 |
9.0 | 12.5 | 400 |
12.5 | 20.0 | 500 |
20.0 | 30.0 | 750 |
30.0 | 50.0 | 1000 |
50.0 | 75.0 | 1250 |
75.0 | - | 1500 |
Table 2：Samples of soft cable, soft wire and communication cable, the falling weight should be specified in below table:
OD mm | Falling weight (g) | |
> | < & = | |
Flat cord | 100 | |
- | 6.0 | 100 |
6.0 | 10.0 | 200 |
10.0 | 15.0 | 300 |
15.0 | 25.0 | 400 |
25.0 | 35.0 | 500 |
35.0 | - | 600 |
