Test Probe A (Φ50 sphere with handle）
Test Probe A (Φ50 sphere with handle）
- Detail
- Parameters
Test Probe A for IP1X Testing: Φ50 sphere with handle
1. Introduction:
Test probe A ( Φ50 sphere with handle) is designed according to IEC61032 fig.1, and meet the requirements of IEC60529 regarding IP1X testing and IEC60065. This probe is intended to verify the protection of persons against access to hazardous parts. This probe can work with control panel to work with control panel to form a continuity indicating circuit.
Test probe A with 50N force is means for the protection of person’s back of hand from hazard parts.
2. Specification
Diameter of test sphere: | 50mm | Diameter of baffle: | 50mm |
Thickness of baffle: | 4mm | Diameter of handle: | 10mm |
Length of handle: | 100mm | Thruster (optional) : | 50N |
Material: insulating material (handle and baffle), metal (test sphere) | |||
3. IP code Test Probe Kits:
Test Probe A for IP10 Testing: Φ50 sphere with handle
Test Probe B for IP20 Testing: jointed test finger
Test probe C for IP30 Testing: Φ2.5 rod-length 100
Test Probe D for IP40 Testing: Φ1.0 wire-length 100
Test Probe 1 for IP10 Testing: 500g steel sphere
Test Probe 2 for IP20 Testing: 15g steel sphere
